Carte VLSI Design and Test Singh Manoj Gaur

VLSI Design and Test

17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

Limbă: engleză
Legare: Carte broșată
Disponibilitate: În depozitul extern
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275.71 lei
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design an...

Informații despre carte

Limbă
engleză
Legare
Carte - Carte broșată
Publicat
2013
Pagini
388
EAN
9783642420238
ISBN
3642420230
Enbook ID
02198670
Greutate
6088
Dimensiuni
155 x 235 x 22

Descriere completă

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

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