Carte X-Ray Diffraction by Disordered Lamellar Structures Victor A. Drits

X-Ray Diffraction by Disordered Lamellar Structures

Theory and Applications to Microdivided Silicates and Carbons

Limbă: engleză
Legare: Carte broșată
Disponibilitate: În depozitul extern
Expediem în 5-8 zile
552.06 lei
New methods for the determination of the nature, proportion, and distribution of structural defects...

Informații despre carte

Limbă
engleză
Legare
Carte - Carte broșată
Publicat
2011
Pagini
371
EAN
9783642748042
ISBN
364274804X
Enbook ID
06920973
Greutate
593
Dimensiuni
155 x 235 x 22

Descriere completă

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.

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