Carte VLSI Design and Test S. Rajaram

VLSI Design and Test

22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

Limbă: engleză
Legare: Carte broșată
Disponibilitate: În depozitul extern
Expediem în 5-8 zile
550.51 lei
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design an...

Informații despre carte

Limbă
engleză
Legare
Carte - Carte broșată
Publicat
2019
Pagini
722
EAN
9789811359491
Enbook ID
20943800
Greutate
1116
Dimensiuni
155 x 235 x 40

Descriere completă

This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.

S-ar putea să te intereseze

My Son's Story

Nadine Gordimer
86.73 lei

Who Was Wolfgang Amadeus Mozart

Yona Zeldis McDonough
33.70 lei

Superstition and Force

Henry Charles Lea
143.78 lei
1 264.65 lei
148.31 lei

Open Secrets

Robert Winder
22.23 lei

Clienții care au cumpărat această carte au mai cumpărat și