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Carte Testing Static Random Access Memories Said Hamdioui

Testing Static Random Access Memories

Defects, Fault Models and Test Patterns

Autor: Said Hamdioui
Limbă: engleză
Legare: Copertă tare
Editura: Springer-Verlag New York Inc.
Disponibilitate: În depozitul extern
Expediem în 10-13 zile
553.26 lei
"Testing Static Random Access Memories" covers testing of one of the important semiconductor memorie...

Informații despre carte

Autor
Said Hamdioui
Limbă
engleză
Legare
Carte - Copertă tare
Publicat
2004
Pagini
221
EAN
9781402077524
ISBN
1402077521
Enbook ID
01418168
Editura
Springer-Verlag New York Inc.
Greutate
1150
Dimensiuni
155 x 235 x 18

Descriere completă

"Testing Static Random Access Memories" covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing.

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