Carte Surface Roughness Study by Atomic Force Microscopy Md.Abu Sayeed

Surface Roughness Study by Atomic Force Microscopy

Surface Roughness-Practical Example

Limbă: engleză
Legare: Carte broșată
Disponibilitate: La editor doar la comandă
Expediem în 17-27 zile
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AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capab...

Informații despre carte

Limbă
engleză
Legare
Carte - Carte broșată
Publicat
2012
Pagini
72
EAN
9783848400355
Enbook ID
07085730
Greutate
118
Dimensiuni
152 x 229 x 4

Descriere completă

AFM is becoming a key technique in many fields of nano-science and nano-technology. The AFM is capable of measuring nanometer scale images of insulating surfaces with thickness as well as measuring three dimensional images of surfaces and studying the topography. It is very suitable for biological system to determine substrate roughness analysis. The chitinous materials that mean microbiological matter are imaged for determining the surface roughness and interaction force of microbial surfaces by AFM.

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