Carte Surface plasmons resonance spectroscopy Felix Ntui Ayuk

Surface plasmons resonance spectroscopy

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Legare: Carte broșată
Disponibilitate: În depozitul extern
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258.53 lei
The diverse applications of surface plasmons resonance spectroscopy are well know and understood. X-...

Informații despre carte

Limbă
engleză
Legare
Carte - Carte broșată
Publicat
2011
Pagini
120
EAN
9783838128375
ISBN
3838128370
Enbook ID
07028429
Greutate
192
Dimensiuni
228 x 154 x 14

Descriere completă

The diverse applications of surface plasmons resonance spectroscopy are well know and understood. X-ray spectroscopy has proven to be one of the most useful tools in the study of thin filmm. The lateral electron density variation within a thin film (measured using x-ray spectroscopy) and the dielectric constant variation of the thin film (investigated using surface plasmons resonance spectroscopy) are however linearly related to one onother. It is in the light of the linearity between these two pyzsical quantities that prompted us to combine both spectroscopic analysis processes in one device. In this way it was posible to use the results obtain from x-ray reflectivity and work back to verify the results obtain from the surface plasmons resonance scans. This was realise for static s well as for dynamic processes within a thin film of polymer.

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