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Structural, Syntactic, and Statistical Pattern Recognition

Name: Structural, Syntactic, and Statistical Pattern Recognition
Brand: Springer International Publishing AG
SKU: 9783319490540
Price: 276.9 RON
Availability: InStock

Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings

Autor: Antonio Robles-Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson

Limbă:

Legare: Carte broșată

Editura: Springer International Publishing AG

Disponibilitate: În depozitul extern

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This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntact...

Informații despre carte

Autor

Antonio Robles-Kelly, Marco Loog, Battista Biggio, Francisco Escolano, Richard Wilson

Limbă

engleză

Legare

Carte - Carte broșată

Publicat

2016

Pagini

588

EAN

9783319490540

ISBN

3319490540

Enbook ID

15194771

Editura

Springer International Publishing AG

Greutate

9007

Dimensiuni

155 x 235 x 32

Descriere completă

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis.