Soft Error Mechanisms, Modeling and Mitigation

Name: Soft Error Mechanisms, Modeling and Mitigation
Brand: Springer International Publishing AG
SKU: 9783319306063
Price: 276.36 RON
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Autor: Selahattin Sayil

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Legare: Copertă tare

Editura: Springer International Publishing AG

Disponibilitate: În depozitul extern

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276.36 lei

This§book introduces readers to various radiation soft-error mechanisms such as soft§delays, radiati...

Informații despre carte

Autor

Selahattin Sayil

Limbă

engleză

Legare

Carte - Copertă tare

Publicat

2016

Pagini

105

EAN

9783319306063

ISBN

3319306065

Enbook ID

02926232

Editura

Springer International Publishing AG

Greutate

379

Dimensiuni

155 x 235 x 13

Descriere completă

This§book introduces readers to various radiation soft-error mechanisms such as soft§delays, radiation induced clock jitter and pulses, and single event (SE)§coupling induced effects. In addition to discussing various radiation hardening§techniques for combinational logic, the author also describes new mitigation§strategies targeting commercial designs. Coverage includes novel soft error§mitigation techniques such as the Dynamic Threshold Technique and Soft Error§Filtering based on Transmission gate with varied gate and body bias. The discussion also includes modeling of SE§crosstalk noise, delay and speed-up effects. Various mitigation strategies to§eliminate SE coupling effects are also introduced. Coverage also includes the reliability of low§power energy-efficient designs and the impact of leakage power consumption§optimizations on soft error robustness. The author presents an analysis of various power optimization techniques,§enabling readers to make design choices that reduce static power consumption§and improve soft error reliability at the same time. §§

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