Semiconductor Memory Testing

Name: Semiconductor Memory Testing
Brand: VDM Verlag Dr. Müller
SKU: 9783639194401
Price: 254.63 RON
Availability: InStock

Fault Models and Test Considerations for High Performance Embedded SRAM's

Autor: Anuj Gupta

Limbă:

Legare: Carte broșată

Editura: VDM Verlag Dr. Müller

Disponibilitate: La editor doar la comandă

Expediem în 17-27 zile

254.63 lei

Stringent test quality requirements, at-speed test limitations & total cost associated with using ex...

Informații despre carte

Autor

Anuj Gupta

Limbă

engleză

Legare

Carte - Carte broșată

Publicat

2009

Pagini

EAN

9783639194401

Enbook ID

06827526

Editura

VDM Verlag Dr. Müller

Greutate

114

Dimensiuni

151 x 4 x 10

Descriere completă

Stringent test quality requirements, at-speed test limitations & total cost associated with using expensive off-chip testers for embedded memory testing have forced system designers to introduce on-chip Memory Built-in Self Test (MBIST) techniques to generate, apply, read and compares test patterns in order to expose subtle defects of SRAM''s. The book discusses in detail the various fault models and test requirements associated with embedded SRAM s in today s System-On-Chip s and focuses on the implementation of testing algorithms for embedded SRAMs in the MBIST engine. The book also discusses a finding where failure analysis and silicon debug required an update to the algorithms and pattern backgrounds implemented in the MBIST.

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Semiconductor Memory Testing

Fault Models and Test Considerations for High Performance Embedded SRAM's

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