Semiconductor Material and Device Characterization 3e

Name: Semiconductor Material and Device Characterization 3e
Brand: John Wiley & Sons Inc
SKU: 9780471739067
Price: 1346.26 RON
Availability: InStock

Autor: Dieter K. Schroder

Limbă:

Legare: Copertă tare

Editura: John Wiley & Sons Inc

Disponibilitate: În depozitul extern

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1 346.26 lei

Semiconductor Material and Device Characterization is the only book on the market devoted to the cha...

Informații despre carte

Autor

Dieter K. Schroder

Limbă

engleză

Legare

Carte - Copertă tare

Publicat

2006

Pagini

800

EAN

9780471739067

ISBN

0471739065

Enbook ID

01389606

Editura

John Wiley & Sons Inc

Greutate

1324

Dimensiuni

243 x 238 x 51

Descriere completă

Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques. In the third edition, Professor Schroder has rewritten parts of each chapter and added two new chapters (Charge Based Measurements and Failure Analysis and Reliability), redrawn and updated most figures, and included new problems and approximately 100 new references.

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