Carte Scanning Probe Microscopy Bert Voigtlander

Scanning Probe Microscopy

Atomic Force Microscopy and Scanning Tunneling Microscopy

Limbă: engleză
Legare: Carte broșată
Disponibilitate: În depozitul extern
Expediem în 10-18 zile
946.97 lei
This book explains the operating principles of atomic force microscopy and scanning tunneling micros...

Informații despre carte

Limbă
engleză
Legare
Carte - Carte broșată
Publicat
2016
Pagini
382
EAN
9783662505571
ISBN
3662505576
Enbook ID
15201769
Greutate
6029
Dimensiuni
155 x 235 x 22

Descriere completă

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

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