Scanning Electron Microscopy

Name: Scanning Electron Microscopy
Brand: NY RESEARCH PRESS
SKU: 9781632384065
Price: 677.72 RON
Availability: InStock

Autor: Lisa Page

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Editura: NY RESEARCH PRESS

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Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments empl...

Informații despre carte

Autor

Lisa Page

Limbă

engleză

Legare

Carte - Copertă tare

Publicat

2015

Pagini

292

EAN

9781632384065

ISBN

163238406X

Enbook ID

12434612

Editura

NY RESEARCH PRESS

Greutate

572

Dimensiuni

236 x 162 x 23

Descriere completă

Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book focuses on various issues concerned with scanning electron microscopy, covering both theoretical and practical aspects. Numerous topics are organized under two sections, "Material Science" and "Nanostructured Materials for Electronic Industry". This book includes contributions by renowned researchers and experts in this field.

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Scanning Electron Microscopy

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