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Reliability Prediction from Burn-In Data Fit to Reliability Models

Name: Reliability Prediction from Burn-In Data Fit to Reliability Models
Brand: Academic Press
SKU: 9780128007471
Price: 330.77 RON
Availability: InStock

Autor: Joseph Bernstein

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Legare: Carte broșată

Editura: Academic Press

Disponibilitate: În depozitul extern

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330.77 lei

This work will educate chip and system designers on a method for accurately predicting circuit and s...

Informații despre carte

Autor

Joseph Bernstein

Limbă

engleză

Legare

Carte - Carte broșată

Publicat

2014

Pagini

108

EAN

9780128007471

ISBN

0128007478

Enbook ID

02506326

Editura

Academic Press

Greutate

162

Dimensiuni

154 x 228 x 6

Descriere completă

This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions. This book will allow chip designers to predict FIT and DPPM values as a function of operating conditions and chip temperature so that users ultimately will have control of reliability in their design so the reliability and performance will be considered concurrently with their design. Features: the ability to include reliability calculations and test results in their product design; the ability to use reliability data provided to them by their suppliers to make meaningful reliability predictions; and have accurate failure rate calculations for calculating warrantee period replacement costs.

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Reliability Prediction from Burn-In Data Fit to Reliability Models

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Descriere completă

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