Point and Extended Defects in Semiconductors

Name: Point and Extended Defects in Semiconductors
Brand: Springer-Verlag New York Inc.
SKU: 9781468457117
Price: 296.91 RON
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Autor: Giorgio Benedek

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Editura: Springer-Verlag New York Inc.

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The systematic study of defects in semiconductors began in the early fifties. FrQm that time on many...

Informații despre carte

Autor

Giorgio Benedek

Limbă

engleză

Legare

Carte - Carte broșată

Publicat

2013

Pagini

287

EAN

9781468457117

ISBN

146845711X

Enbook ID

02253876

Editura

Springer-Verlag New York Inc.

Greutate

574

Dimensiuni

178 x 254 x 17

Descriere completă

The systematic study of defects in semiconductors began in the early fifties. FrQm that time on many questions about the defect structure and properties have been an swered, but many others are still a matter of investigation and discussion. Moreover, during these years new problems arose in connection with the identification and char acterization of defects, their role in determining transport and optical properties of semiconductor materials and devices, as well as from the technology of the ever in creasing scale of integration. This book presents to the reader a view into both basic concepts of defect physics and recent developments of high resolution experimental techniques. The book does not aim at an exhaustive presentation of modern defect physics; rather it gathers a number of topics which represent the present-time research in this field. The volume collects the contributions to the Advanced Research Workshop "Point, Extended and Surface Defects in Semiconductors" held at the Ettore Majo rana Centre at Erice (Italy) from 2 to 7 November 1988, in the framework of the International School of Materials Science and Technology. The workshop has brought together scientists from thirteen countries. Most participants are currently working on defect problems in either silicon submicron technology or in quantum wells and superlattices, where point defects, dislocations, interfaces and surfaces are closely packed together.

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