Carte Noncontact Atomic Force Microscopy Seizo Morita

Noncontact Atomic Force Microscopy

Volume 2

Limbă: engleză
Legare: Copertă tare
Disponibilitate: În depozitul extern
Expediem în 10-13 zile
1 215.34 lei
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic...

Informații despre carte

Limbă
engleză
Legare
Carte - Copertă tare
Publicat
2009
Pagini
401
EAN
9783642014949
ISBN
3642014941
Enbook ID
01649678
Greutate
870
Dimensiuni
155 x 235 x 30

Descriere completă

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

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