Carte Noncontact Atomic Force Microscopy Seizo Morita

Noncontact Atomic Force Microscopy

Limbă: engleză
Legare: Copertă tare
Disponibilitate: În depozitul extern
Expediem în 10-13 zile
1 102.66 lei
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based...

Informații despre carte

Limbă
engleză
Legare
Carte - Copertă tare
Publicat
2002
Pagini
440
EAN
9783540431176
ISBN
3540431179
Enbook ID
01564043
Greutate
912
Dimensiuni
164 x 241 x 35

Descriere completă

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.

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