Nanometer Technology Designs

Name: Nanometer Technology Designs
Brand: Springer-Verlag New York Inc.
SKU: 9780387764863
Price: 553.26 RON
Availability: InStock

High-Quality Delay Tests

Autor: Mohammad Tehranipoor, Nisar Ahmed

Limbă:

Legare: Copertă tare

Editura: Springer-Verlag New York Inc.

Disponibilitate: În depozitul extern

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553.26 lei

Adopting new fabrication technologies not only provides higher integration and enhances performance,...

Informații despre carte

Autor

Mohammad Tehranipoor, Nisar Ahmed

Limbă

engleză

Legare

Carte - Copertă tare

Publicat

2007

Pagini

281

EAN

9780387764863

ISBN

0387764860

Enbook ID

01382894

Editura

Springer-Verlag New York Inc.

Greutate

626

Dimensiuni

164 x 242 x 22

Descriere completă

Adopting new fabrication technologies not only provides higher integration and enhances performance, but also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz timing-related defects havv become a high proportion of the total chip defects. For nanometer technology designs, the stuck-at fault test alone cannot ensure a high quality level of chips. At-speed tests using the transition fault model has become a requirement in technologies below 180nm.§Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise (including IR-drop, ground bounce, and Ldi/dt) effects on chip performance, high test pattern volume, low fault/defect coverage, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.

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Nanometer Technology Designs

High-Quality Delay Tests

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