Modeling and Multiresolution Characterization of Micro/nano Surface

Name: Modeling and Multiresolution Characterization of Micro/nano Surface
Brand: VDM Verlag
SKU: 9783639266122
Price: 303.82 RON
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Autor: Rajib Mukherjee, José A. Romagnoli

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Editura: VDM Verlag

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Various statistical features can be used to characterize the surface in quantitative way. Such an an...

Informații despre carte

Autor

Rajib Mukherjee, José A. Romagnoli

Limbă

engleză

Legare

Carte - Carte broșată

Publicat

2010

Pagini

124

EAN

9783639266122

ISBN

3639266129

Enbook ID

06833921

Editura

VDM Verlag

Greutate

191

Dimensiuni

152 x 229 x 7

Descriere completă

Various statistical features can be used to characterize the surface in quantitative way. Such an analysis can be done by the multi-resolution capabilities of wavelet transforms (WT) of the surface microscopic image. A multi-scale molecular model can help to investigate the physical and chemical mechanism in manufacturing process. Multiresolution characterization can be performed on the model structure to compare with image analysis. In this book, we have used a soft polymeric surface and applied multiresolution characterization for surface feature extraction and multiscale modeling for optimizing system variables to get desired surface characteristics. In microfabrication, the efficiency of the product reduced by line-edge roughness (LER). Off-line LER characterization is usually based on the top-down SEM image. This book shows wavelet based segmentation method for edge searching region as well as wavelet based characterization. For mesoscale modeling, the Flory-Huggins interaction parameters of the clusters of atoms or molecules are used. We have identified the phase separation by spinodal decomposition resulting in the formation of LER on polymer surface.

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