Carte Materials Reliability in Microelectronics V: Volume 391 William F. Filter

Materials Reliability in Microelectronics V: Volume 391

Limbă: engleză
Legare: Copertă tare
Disponibilitate: Retipărire preconizată
Termenul este necunoscut
135.10 lei
This long-standing proceedings series is highly regarded as a premier forum for the discussion of mi...

Informații despre carte

Limbă
engleză
Legare
Carte - Copertă tare
Publicat
1995
Pagini
523
EAN
9781558992948
ISBN
1558992944
Enbook ID
02060054
Greutate
886
Dimensiuni
157 x 234 x 33

Descriere completă

This long-standing proceedings series is highly regarded as a premier forum for the discussion of microelectronics reliability issues. In this fifth book, emphasis is on the fundamental understanding of failure phenomena in thin-film materials. Special attention is given to electromigration and mechanical stress effects. The reliability of thin dielectrics and hot carrier degradation of transistors are also featured. Topics include: modeling and simulation of failure mechanisms; reliability issues for submicron IC technologies and packaging; stresses in thin films/lines; gate oxides; barrier layers; electromigration mechanisms; reliability issues for Cu metallizations; electromigration and microstructure; electromigration and stress voiding in circuit interconnects; and resistance measurements of electromigration damage.

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