Manufacturing Metrology

Name: Manufacturing Metrology
Brand: MDPI AG
SKU: 9783036529868
Price: 500.6 RON
Availability: InStock

Autor: Peter Kinnell

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Legare: Copertă tare

Editura: MDPI AG

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500.60 lei

Metrology is the science of measurement, which can be divided into three overlapping activities: (1)...

Informații despre carte

Autor

Peter Kinnell

Limbă

engleză

Legare

Carte - Copertă tare

Publicat

2022

Pagini

414

EAN

9783036529868

ISBN

3036529861

Enbook ID

41366132

Editura

MDPI AG

Greutate

1089

Dimensiuni

170 x 244 x 32

Descriere completă

Metrology is the science of measurement, which can be divided into three overlapping activities: (1) the definition of units of measurement, (2) the realization of units of measurement, and (3) the traceability of measurement units. Manufacturing metrology originally implicates the measurement of components and inputs for a manufacturing process to assure they are within specification requirements. It can also be extended to indicate the performance measurement of manufacturing equipment. This Special Issue covers papers revealing novel measurement methodologies and instrumentations for manufacturing metrology from the conventional industry to the frontier of the advanced hi-tech industry. Twenty-five papers are included in this Special Issue. These published papers can be categorized into four main groups, as follows:
Length measurement: covering new designs, from micro/nanogap measurement with laser triangulation sensors and laser interferometers to very-long-distance, newly developed mode-locked femtosecond lasers.
Surface profile and form measurements: covering technologies with new confocal sensors and imagine sensors: in situ and on-machine measurements.
Angle measurements: these include a new 2D precision level design, a review of angle measurement with mode-locked femtosecond lasers, and multi-axis machine tool squareness measurement.
Other laboratory systems: these include a water cooling temperature control system and a computer-aided inspection framework for CMM performance evaluation.

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