Linear Models for Optimal Test Design

Name: Linear Models for Optimal Test Design
Brand: Springer-Verlag New York Inc.
SKU: 9780387202723
Price: 583.6 RON
Availability: InStock

Autor: Wim J. van der Linden

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Legare: Copertă tare

Editura: Springer-Verlag New York Inc.

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This book begins with a reflection on the history of test design--the core activity of all education...

Informații despre carte

Autor

Wim J. van der Linden

Limbă

engleză

Legare

Carte - Copertă tare

Publicat

2005

Pagini

408

EAN

9780387202723

ISBN

0387202722

Enbook ID

01380901

Editura

Springer-Verlag New York Inc.

Greutate

1730

Dimensiuni

155 x 235 x 27

Descriere completă

This book begins with a reflection on the history of test design--the core activity of all educational and psychological testing. It then presents a standard language for modeling test design problems as instances of multi-objective constrained optimization. The main portion of the book discusses test design models for a large variety of problems from the daily practice of testing, and illustrates their use with the help of numerous empirical examples. The presentation includes models for the assembly of tests to an absolute or relative target for their information functions, classical test assembly, test equating problems, item matching, test splitting, simultaneous assembly of multiple tests, tests with item sets, multidimensional tests, and adaptive test assembly. Two separate chapters are devoted to the questions of how to design item banks for optimal support of programs with fixed and adaptive tests. Linear Models for Optimal Test Design, which does not require any specific mathematical background, has been written to be a helpful resource on the desk of any test specialist.

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Linear Models for Optimal Test Design

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