Digital System Test and Testable Design

Name: Digital System Test and Testable Design
Brand: Springer-Verlag New York Inc.
SKU: 9781441975478
Price: 635.58 RON
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Autor: Zainalabedin Navabi

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Legare: Copertă tare

Editura: Springer-Verlag New York Inc.

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635.58 lei

This book is about digital system testing and testable design. The concepts of testing and testabili...

Informații despre carte

Autor

Zainalabedin Navabi

Limbă

engleză

Legare

Carte - Copertă tare

Publicat

2010

Pagini

435

EAN

9781441975478

ISBN

1441975470

Enbook ID

01424239

Editura

Springer-Verlag New York Inc.

Greutate

2230

Dimensiuni

178 x 254 x 35

Descriere completă

This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms.§Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies.

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Digital System Test and Testable Design

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