Carte Design for Testability, Debug and Reliability Sebastian Huhn

Design for Testability, Debug and Reliability

Limbă: engleză
Legare: Copertă tare
Disponibilitate: În depozitul extern
Expediem în 10-13 zile
606.14 lei
This book introduces several novel approaches to pave the way for the next generation of integrated...

Informații despre carte

Limbă
engleză
Legare
Carte - Copertă tare
Publicat
2021
Pagini
188
EAN
9783030692087
ISBN
3030692086
Enbook ID
35705730
Greutate
453
Dimensiuni
160 x 241 x 16

Descriere completă

This book introduces several novel approaches to pave the way for the next generation of integrated circuits, which can be successfully and reliably integrated, even in safety-critical applications. The authors describe new measures to address the rising challenges in the field of design for testability, debug, and reliability, as strictly required for state-of-the-art circuit designs. In particular, this book combines formal techniques, such as the Satisfiability (SAT) problem and the Bounded Model Checking (BMC), to address the arising challenges concerning the increase in test data volume, as well as test application time and the required reliability. All methods are discussed in detail and evaluated extensively, while considering industry-relevant benchmark candidates. All measures have been integrated into a common framework, which implements standardized software/hardware interfaces.

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