Carte Defects, Fracture and Fatigue G. Sih

Defects, Fracture and Fatigue

Proceedings of the Second International Symposium, held at Mont Gabriel, Canada, May 30-June 5, 1982

Autor: G. Sih
Limbă: engleză
Legare: Carte broșată
Editura: Springer
Disponibilitate: În depozitul extern
Expediem în 5-8 zile
276.84 lei
The Second International Symposium on Defects, Fracture and Fatigue took place at Mont Gabriel, Queb...

Informații despre carte

Autor
Limbă
engleză
Legare
Carte - Carte broșată
Publicat
2011
Pagini
489
EAN
9789400968233
ISBN
940096823X
Enbook ID
02183869
Editura
Greutate
783
Dimensiuni
155 x 235 x 28

Descriere completă

The Second International Symposium on Defects, Fracture and Fatigue took place at Mont Gabriel, Quebec, Canada, May 30 to June 5, 1982, and was organized by the Mechanical Engineering Department of McGill University and Institute of Fracture and Solid Mechanics, Lehigh University. The Co-Chairmen of the Sympo sium were Professor G. C. Sih of Lehigh University and Professor J. W. Provan of McGill University. Among those who served on the Organizing Committee were G. C. Sih (Co-Chairman), J. W. Provan (Co-Chairman), H. Mughrabi, H. Zorski, R. Bullough, M. Matczynski, G. Barenblatt and G. Caglioti. As a result of the interest expressed at the First Symposium that was held in October 1980, in Po land, the need for a follow-up meeting to further explore the phenomena of mate rial damage became apparent. Among the areas considered were dislocations, per sistent-slip-bands, void creation, microcracking, microstructure effects, micro/ macro fracture mechanics, ductile fracture criteria, fatigue crack initiation and propagation, stress and failure analysis, deterministic and statistical crack models, and fracture control. This wide spectrum of topics attracted researchers and engineers in solid state physics, continuum mechanics, applied mathematics, metallurgy and fracture mechanics from many different countries. This spectrum is also indicative of the interdisciplinary character of material damage that must be addressed at the atomic, microscopic and macroscopic scale level.

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