Characterization of Microstructures by Analytical Electron Microscopy (AEM)

Name: Characterization of Microstructures by Analytical Electron Microscopy (AEM)
Brand: Springer, Berlin
SKU: 9783642201189
Price: 1135.8 RON
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Autor: Yonghua Rong

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Editura: Springer, Berlin

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"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic co...

Informații despre carte

Autor

Yonghua Rong

Limbă

engleză

Legare

Carte - Copertă tare

Publicat

2011

Pagini

500

EAN

9783642201189

Enbook ID

01657685

Editura

Springer, Berlin

Greutate

998

Dimensiuni

155 x 235 x 36

Descriere completă

"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations. §The book is intended for researchers and graduate students in materials science, engineering, and condensed matter physics.§Yonghua Rong is a professor at the School of Materials Science and Engineering, Shanghai Jiao Tong University, China.

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Characterization of Microstructures by Analytical Electron Microscopy (AEM)

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