Carte Characterization In Compound Semiconductor Processing McGuire

Characterization In Compound Semiconductor Processing

Autor: McGuire
Limbă: engleză
Legare: Copertă tare
Editura: Momentum Press
Disponibilitate: Retipărire preconizată
Termenul este necunoscut
610.70 lei
Compound semiconductors such as Gallium Arsenide, Gallium Aluminum Arsenide, and Indium Phosphide ar...

Informații despre carte

Autor
Limbă
engleză
Legare
Carte - Copertă tare
Publicat
2010
Pagini
212
EAN
9781606500415
ISBN
1606500414
Enbook ID
01220104
Editura
Greutate
474
Dimensiuni
158 x 242 x 16

Descriere completă

Compound semiconductors such as Gallium Arsenide, Gallium Aluminum Arsenide, and Indium Phosphide are often difficult to characterize and present a variety of challenges from substrate preparation, to epitaxial growth to dielectric film deposition to dopant introduction. This book reviews the common classes of compound semiconductors, their physical, optical and electrical properties and the various types of methods used for characterizing them when analyzing for defects and application problems. The book features:§Characterization of III-V Thin Films for Electronic and Optical applications §Characterization of Dielectric Insulating Film layers §A Special case study on Deep Level Transient Spectroscopy on GaAs §Concise summaries of major characterization technologies for compound semiconductor materials, including Auger Electron Spectroscopy, Ballistic Electron Emission Microscopy, Energy-Dispersive X-Ray Spectroscopy, Neutron Activation Analysis and Raman Spectroscopy

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