Carte Atomic Force Microscopy: A Concise Introduction BURNHAM NANCY A

Atomic Force Microscopy: A Concise Introduction

Limbă: engleză
Legare: Copertă tare
Disponibilitate: În depozitul extern
Expediem în 9-15 zile
494.00 lei
This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) - a fu...

Informații despre carte

Limbă
engleză
Legare
Carte - Copertă tare
Publicat
2025
Pagini
250
EAN
9789819823093
ISBN
9819823099
Enbook ID
49878957
Greutate
458

Descriere completă

This book offers a comprehensive and accessible introduction to atomic force microscopy (AFM) - a fundamental technique in nanoscience, nanotechnology, and materials characterization. While the basic operating principle of AFM is straightforward, the processes of data acquisition, quantitative analysis, and interpretation require deeper scientific understanding.

Designed for readers with a first-year university background in mathematics and physics, this text builds a strong foundation for mastering both the practical and theoretical aspects of AFM.

  • Part I - AFM Instrumentation: Explains the working principles, components, and imaging modes of atomic force microscopy, enabling readers to confidently obtain high-quality topographic images from any AFM system.
  • Part II - Force-Curve Acquisition and Interpretation: Guides readers through force spectroscopy, demonstrating how force-distance curves are acquired and interpreted while connecting the results to underlying physical and materials science principles.
  • Advanced Chapter - Dynamic AFM Techniques: Introduces dynamic and resonance-based AFM, using complex numbers and differential equations to explain advanced imaging and measurement methods.

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