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Carte Applied Measurement with jMetrik J. Patrick Meyer

Applied Measurement with jMetrik

Autor: J. Patrick Meyer
Limbă: engleză
Legare: Copertă tare
Editura: Taylor & Francis Ltd
Disponibilitate: În depozitul extern
Expediem în 14-21 zile
1 302.46 lei
jMetrik is a computer program for implementing classical and modern psychometric methods. It is desi...

Informații despre carte

Autor
J. Patrick Meyer
Limbă
engleză
Legare
Carte - Copertă tare
Publicat
2014
Pagini
170
EAN
9780415531955
ISBN
9780415531955
Enbook ID
06670140
Editura
Taylor & Francis Ltd
Greutate
362
Dimensiuni
152 x 229 x 15

Descriere completă

jMetrik is a computer program for implementing classical and modern psychometric methods. It is designed to facilitate work in a production environment and to make advanced psychometric procedures accessible to every measurement practitioner. App

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