Anomalous X-Ray Scattering for Materials Characterization

Name: Anomalous X-Ray Scattering for Materials Characterization
Brand: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
SKU: 9783662146378
Price: 1151.32 RON
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Atomic-Scale Structure Determination

Autor: Yoshio Waseda

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Editura: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

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The evolution of our understanding of most properties of new functional materials is related to our...

Informații despre carte

Autor

Yoshio Waseda

Limbă

engleză

Legare

Carte - Carte broșată

Publicat

2013

Pagini

214

EAN

9783662146378

ISBN

3662146371

Enbook ID

02182862

Editura

Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Greutate

361

Dimensiuni

155 x 12 x 13

Descriere completă

The evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scattering (AXS) method, exploiting the so-called anomalous dispersion effect near the absorption edge of the constituent element, is one of the most powerful methods for determining the accurate partial structure functions of individual pairs of constituents or the environmental functions around specific elements in multicomponent systems. AXS is useful for both crystalline and non-crystalline systems, for studies of surface and bulk materials. This book is the first on this new method of structural characterization. It describes the basics and application principles, and also treats the specifics of application to liquid alloys, supercooled liquids, solutions, metallic glasses, oxide glasses, superconducting ionic glasses etc.

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Anomalous X-Ray Scattering for Materials Characterization

Atomic-Scale Structure Determination

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