Carte Advances in Imaging and Electron Physics Peter W. Hawkes

Advances in Imaging and Electron Physics

Optics of Charged Particle Analyzers

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Legare: Copertă tare
Disponibilitate: La editor doar la comandă
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1 070.54 lei
"Advances in Imaging and Electron Physics" merges two long-running serials - "Advances in Electronic...

Informații despre carte

Limbă
engleză
Legare
Carte - Copertă tare
Publicat
2010
Pagini
248
EAN
9780123813145
ISBN
012381314X
Enbook ID
04494500
Greutate
460
Dimensiuni
152 x 229 x 18

Descriere completă

"Advances in Imaging and Electron Physics" merges two long-running serials - "Advances in Electronics" and "Electron Physics and Advances in Optical and Electron Microscopy". This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This title includes contributions from leading international scholars and industry experts. It discusses hot topic areas and presents current and future research trends. It is invaluable reference and guide for physicists, engineers and mathematicians.

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